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oxide after Fowler-Nordheim current stress, Reliability Physics Symposium, 1996. 34th Annual Proceedings., IEEE International 30 April-2, pp.108 - 112, May 1996.
ABSTRACT
Jae-Gu Son
Dept. of Electronic Eng.
Graduate School
Cheongju Univ.
Advesed by
Prof. Hong-Bae Kim
In this paper, the inspection o
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6_Flexible Display (고려대학교 권재홍, 정진
욱, 이영훈, 이원희) 1. 서 론
2. 이 론
1) PDMS (Polydimethylsiloxane)
2) Nano Transfer Printing
3) Decal Tranfer Lithography (DTL)
4) ITO (Indium Tin Oxide)
3. 실험방법
4. 결과 및 고찰
5. 결 론
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