|
없을 때를 total deep depletion Ⅰ. C-V Introduction
Ⅱ. I-V measurement
1. Introduction
2. Metal-Insulator contacts
3. Image-force effect
4. Conduction mechanism
(1) Electrode-limited current
(2) Bulk-limited current
5. 실제 Data
|
|
|
force and fatigue of flexor digitorum superficialis, Applied Ergonomics, 30, 401-405, 1999.
Kim, D.M, Kong, Y.K, Research of Grip Forces and Subjective Preferences for Various Individual Finger Grip Spans by using an "Adjustable Multi.Finger Force Measurement (MFFM) System", Journal of the Ergonomic
|
|
|
Measurement of Development Correspondence Course in Social Planning, ESA/SD/CCSP 1/2, New York, 1972.
UNRISD, Socio-Economic Development : An Inquiry into International Indicators of Development, Measurement and Analysis and Quantitative Interrelations of Social and Economic Conponents of Developmen
|
|
|
Force1
Force
Measurement
Strain 1 (0)
Measurement
Strain 2 (45)
Measurement
Strain 3 (90)
10N
평균
Force
Measurement
Strain 1 (0)
Measurement
Strain 2 (45)
Measurement
Strain 3 (90)
15N
평균
Force2
Force
Measurement
Strain 1 (0)
Measurement
Strain 2 (45)
Measurement
Strain 3 (90)
20N
평균
Force3
DAT
|
|
|
bulk current in the insulator
(3) Poole-Frenkel conduction
(4) Hopping conduction
(5) Space charge-limited conduction
V. I-V measurement with HP4145B
1. 측정목적
2. I-V 측정 장비의 구성
2.1 Probe station의 사용법
2.2 측정 장비(HP 4145B )
2.3 Interface computer
V. Reference
|
|
|
cutting speed related to tool wear?
4. What is the relationship between hardness and temperature in metal-cutting tool materials?
5. Why doesn\'t the cutting force Fc increase with increased speed V?
6. Why does the cutting force increase with increased federate or depth-of-cut(DOC)?
7.
|
|
|
Cutting Ceramics with a Technique of Hot Machining, Annals of the CIRP, Vol. 35, 1, 1986, pp. 55-58
2. Takeaki Kitagawa, Katsuhiro Maekawa, Akihiko Kubo, Plasma Hot Machining for Difficult-to cut Materials, JSPE, 53, 01, 1987, pp. 78-84
1. K. H. Fuh, W. C. Chen, P. W. Liang, Temperature rise in twis
|
|
|
Measurement\', 5th. ed., Chapman, London, 1997, p. 300-305
▷ 서정목, 박균영, 이철호, 강태원, 김동선, 김진현, 최재환, “화학공학실험”, 공주대학교 출판부, 90 ~ 92, 2005
▷ McCabe, W. L., J. C. Smith and p. Harriot : \'Unit operation of Chemical engineering\' , 6th edition, McGraw
|
|
|
Measurement Error)
3. 무응답오차(Nonresponse Error)
4. 처리오차(Processing Error)
제3장 범위오차의 보정
제1절 범위오차 발생원인
1. 추출틀 결점 및 범위오차 발생원인
제2절 범위오차 측정 및 보정
1. 범위오차의 측정
2.
|
|
|
일반물리학실험∥
|
|
메뉴펼치기
